3-D field design, migration, and aliasing

John C. Bancroft

ABSTRACT

This paper is a short comment on the field design and processing of 3-D data, related to common midpoint scatter within a 3-D bin. The concern is a loss of high frequencies that occurs in dipping events where the common midpoints are evenly distributed across the bin. One of the factor that must be considered in addressing this apparent problem is the loss of high frequencies that should occur to prevent aliasing of the dipping event. The contents may be controversial, and interesting debate may follow.

View full article as PDF (0.06 Mb)