Numerical Estimation of Angle of Incidence with Bleistein Approach

Ritesh K. Sharma,Gary F. Margrave

ABSTRACT

The angle of incidence, θ i , of a ray is the angle measured from the ray to the reflector normal. Historically, ray tracing is used to compute the angle of incidence. According to ray tracing, a wave can be modeled as a large number of rays (narrow beam), and a ray can be considered locally straight over a very small distance. In ray tracing, Snell's law is used to compute ray path and the angle of incidence. We investigate a method to compute the angle of incidence from the ratio of two reflectivity attributes known as β (reflectivity function) and β 1 . Another method, the ratio of β 2 and β 1 , is also proposed to compute the angle of incidence with less computation. The basic objective of this paper is to verify the proposed approach numerically. A comparative study of the two methods, β/β 1 and β 2 1 , is considered here.

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