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<abstract>
<title>Comparison of two P-S conversion-point  mapping  approaches 
for Vertical Transversely Isotropic (VTI) media</title>
<author>Jianli Yang and Don C. Lawton</author>
<p>Determination of the conversion point is an important step in P-SV
converted-wave survey design and in data processing. Unlike the
midpoint determination in P-P wave exploration that is determined
geometrically, the conversion point in P-S exploration is determined
by physical properties of the formations. In practical processing, it
is obtained by calculation followed by depth-variant sorting. The
depth-dependent conversion-point position is often approximated by
asymptotic conversion point, which is at a constant offset to the
source. The influence of anisotropy on the P-S conversion point has to
be considered together with the effect of reflector depth, offset, as
well as layering. We developed a general raytracing algorithm for
multi-layered VTI modelling using exact velocity equations for weak
anisotropy to map the raypath and the conversion point location. The
conversion point can also be determined by using the
&gamma;<sub>eff</sub> method, where &gamma;<sub>eff</sub> refers to
effective velocity ratio in anisotropic media. Both methods were
applied for a one-layer model and a multi-layered model. In a
single-layer model, the relative error is shown to be less than 8% for
short-to-intermediate offsets. The &gamma;<sub>eff</sub> method can be
applied to obtain the conversion point for offset to depth ratio less
than 1.5. In the multi-layered model, the relative error increases
with the increasing offset and can reach 14% at offsets of twice the
depth.
</p>
</abstract>
