Simulating measurements from physical modeling by Kirchhoff diffraction method

Linping Dong, Zhengsheng Yao, Gary F. Margrave, Eric V. Gallant

The Kirchhoff diffraction method is used to model physical measurements. This method is based on the wave theory solution of the acoustic wave equation. The acoustic response due to a boundary surface can be expressed as a convolution integral of the source wavelet with an impulse response characterizing the geometry of the boundary surface. The results indicate that the simulated data matches the measurements.